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October 2023 |
Volume 9 |
Issue 3 |
ISSN 2395-1680 |
14556 |
EFFICIENT SOC DESIGN FOR EDGE AI APPLICATIONS USING MEMS-BASED SENSORS | Page(s): 1646 - 1651 |
M. Ramya Devi1, I. Jasmine Selvakumari Jeya2, G. Sakthi3, B. Senthilnathan4 |
Hindusthan College of Engineering and Technology, India1, Vellore Institute of Technology, Bhopal, India2, Galgotia University, India3, Jansons Institute of Technology, India4 | Abstract Full Text DOI : 10.21917/ijme.2023.0284 |
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14555 |
INTEGRATING AI-DRIVEN ON-CHIP NEURAL NETWORKS INTO SOC ARCHITECTURES | Page(s): 1640 - 1645 |
Callins Christiyana Chelladurai1, Priyadharsini Kuluchamy2, Sangeetha Santhavaliyan3, T. Samraj Lawrence4 |
SRM Madurai College for Engineering and Technology, India1, Sethu Institute of Technology, India2, Mohamed Sathak Engineering College, India3, Dambi Dollo University, Ethiopia4 | Abstract Full Text DOI : 10.21917/ijme.2023.0283 |
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14554 |
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14551 |
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14550 |
EXPLORING NEUROMORPHIC COMPUTING IN VLSI FOR EFFICIENT AI INFERENCE | Page(s): 1620 - 1627 |
J. Muralidharan1, B. Srinivasa Rao2, Davinder Kumar3, T. Lakshmi Narayana4 |
KPR Institute of Engineering and Technology, India1, Gokaraju Rangaraju Institute of Engineering and Technology, India2, Micron Technology, Telangana, India3, KLM College of Engineering for Women, India 4 | Abstract Full Text DOI : 10.21917/ijme.2023.0280 |
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14543 |
FPGA-BASED HARDWARE ACCELERATION OF MACHINE LEARNING ALGORITHM FOR REAL-TIME IMAGE PROCESSING | Page(s): 1613 - 1619 |
B. Devanathan1, P. Selvaraju2, T. Thulasimani3, Vishal Ratansing Patil4 |
Annamalai University, India1, Excel Engineering College, India2, Bannari Amman Institute of Technology, India3, Pimpri Chinchwad College of Engineering, India4 | Abstract Full Text DOI : 10.21917/ijme.2023.0279 |
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14519 |
MEMS-ENHANCED SENSOR FUSION FOR AUTONOMOUS NAVIGATION IN ROBOTICS | Page(s): 1607 - 1612 |
V.S. Krushnasamy1, Pravin Prakash Adivarekar2, G. Deepa3, Mohammed Azam4, Prince Williams5 |
Dayananda Sagar College of Engineering, India1, A.P.Shah Institute of Technology, India2, Kongu Engineering College, India3, ISL Engineering College, India4, University of Technology and Applied Sciences, Oman5 | Abstract Full Text DOI : 10.21917/ijme.2023.0278 |
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14513 |
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14512 |
DEEP LEARNING-BASED FAULT DETECTION IN NANO ELECTRONICS CIRCUITS FOR ROBUSTNESS ENHANCEMENT | Page(s): 1595 - 1600 |
Arvind Kumar Shukla1, Sachin Vasant Chaudhari2, Narayan Krishan Vyas3, Neerav Nishant4, Mohammed Saleh Al Ansari5 |
IFTM University, India1, Sanjivani College of Engineering, India2, Government Engineering College, Jhalawar, India3, Babu Banarasi Das University, India4, University of Bahrain, Bahrain5 | Abstract Full Text DOI : 10.21917/ijme.2023.0276 |
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14511 |
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