FAILURE RATE ESTIMATION IN FIELD FOR A DEFECT, IN FUNCTION OF MANUFACTURING DEFECTIVITY DENSITY - CASE STUDY FOR A GATE OXIDE RUPTURE ON VALVE DRIVER IN AUTOMOTIVE SEMICONDUCTORCorinne Berges |
RESIDUAL MULTIHEAD MULTILAYER ATTENTION GANS (RMMLA-GANS) FOR AUTOMATED GLAUCOMA DIAGNOSIS: A NOVEL DEEP LEARNING APPROACHP. Neethu Prabhakaran1, Dini Davis2, P.P. Priya3, Mini Mohan4, P.A. Shemitha5 |
OPTIMISING SYSTEM-ON-CHIP ARCHITECTURE USING ASYNCHRONOUS REGRESSION MODELP. Kannan1, P.M. Sithar Selvam2, T. Priya3, S. Murali4 |
ANALYSIS OF COMPLEMENTARY BEAM STRUCTURED RF MEMS SWITCH FOR WIRELESS APPLICATIONSR Raman, T Shanmuganantham |
VERIFICATION AND COMPARISON OF PERFORMANCE PARAMETERS FOR FOLDED CASCODE OPAMP AT DEEP SUB-MICRON LEVELSSaurabh Waykole1, Varsha S Bendre2, A K Kureshi3 |
ENSEMBLE STRATEGY TO MITIGATE ADVERSARIAL ATTACK IN FEDERATED LEARNINGR. Anusuya1, D. Karthika Renuka2, Ashok Kumar3, S.K. Prithika4, S. Mridula5, T. Subhaashini6, R. Tharsha7 |