IMAGE PROCESSING AND CNN BASED MANUFACTURING DEFECT DETECTION AND CLASSIFICATION OF FAULTS IN PHOTOVOLTAIC CELLS

ICTACT Journal on Image and Video Processing ( Volume: 14 , Issue: 3 )

Abstract

Renewable energy resources such as solar energy, biomass, tidal, geothermal, and hydroelectric energy are becoming increasingly important due to their potential to mitigate the negative impacts of climate change and reduce our dependence on finite and polluting fossil fuels. Solar power can provide a clean, sustainable, and reliable source of renewable energy. Important component of solar power generation is the silicon panel and its surface quality is highly related to its robustness and power generation efficiency. Cell breakages resulting from micro-cracks, degradation and shunted areas on cells are proven to cause major issues and these affect the photovoltaic module efficiency and performance. Solar cell defect identification is important because defects in solar cells significantly reduce their efficiency, which in turn affects their power output and lifespan. By identifying and classifying defects during the production of these cells, engineers and researchers can improve the quality control of solar cells, leading to more reliable and efficient solar energy systems. The proposed method in this research paper, utilizes image processing operations such as adaptive Gaussian thresholding, horizontal and vertical line extraction morphological operations, Canny edge detection, K- Means clustering and VGG16 convolutional neural network to identify the defects in solar cells and classify them as defective or non-defective during the manufacturing process itself. Once the defects are classified, the classification data is exported to Excel file and the results are visually represented as labelled images. OpenCV and Keras modules in Python are used to perform the image processing operations which contributes to cost-effective, reduced computation and high-precision solution.

Authors

S. Kanthalakshmi1, S. Maalathy2, P. Satheesh Kumar3
PSG College of Technology, India1,2, Nachimuthu Polytechnic College, India3

Keywords

Black Core Fault, Broken Gate Fault, Crack Fault, Shunt Fault, Image Segmentation, Adaptive Gaussian Thresholding, K-Means Clustering, Convolutional Neural Network, VGG16

Published By
ICTACT
Published In
ICTACT Journal on Image and Video Processing
( Volume: 14 , Issue: 3 )
Date of Publication
February 2024
Pages
3231 - 3236
Page Views
1134
Full Text Views
161

ICT Academy is an initiative of the Government of India in collaboration with the state Governments and Industries. ICT Academy is a not-for-profit society, the first of its kind pioneer venture under the Public-Private-Partnership (PPP) model

Contact Us

ICT Academy
Module No E6 -03, 6th floor Block - E
IIT Madras Research Park
Kanagam Road, Taramani,
Chennai 600 113,
Tamil Nadu, India

For Journal Subscription: journalsales@ictacademy.in

For further Queries and Assistance, write to us at: ictacademy.journal@ictacademy.in