vioft2nntf2t|tblJournal|Abstract_paper|0xf4ff9be82b000000b71f060001000300 This article introduces a power efficient application of FPGA created through a Memory Built in Self Test (MBIST). It has 2-bit Linear Feedback Shift Register (LFSR) array, which changes the direction of the previous process and creates high MBIST structures. This unwanted change affects all MBIST’s power consumption. The proposed MBIST with LFSR ring reduces the power consumption problem. The 2-bit 2N bit model generator is connected to the 2-bit (N-2) and 2-bit 4-bit (N-2) LFSR model generator, which are separately controlled using two separate clocks with two different frequencies, creating each location address high memory test. The proposed architecture has been implemented on Vertex4 FPGA technology in Xilinx software. The results enhance proposed design’s performance when compared it with the existing design.
K Sivakami1, P Vijayalakshmi2, J Jaya3
Nehru Institute of Engineering and Technology, India1, Hindusthan College of Engineering and Technology, India2,Hindusthan College of Engineering and Technology, India3
Xilinx, FPGA, Switching Activity, 2D-LFSR, Ring LFSR (RLFSR), Memory Built in Self Test (MBIST)
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| Published By :
ICTACT
Published In :
ICTACT Journal on Microelectronics
( Volume: 7 , Issue: 2 , Pages: 1134-1140 )
Date of Publication :
July 2021
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100
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