Abstract

In millimeter-wave CMOS circuit design, addressing noise becomes pivotal for optimal performance. This research targets the unique challenges posed by white and speckle noise in time-varying signals, especially in the context of PAPR operational transconductance amplifiers (OTAs). The introduction highlights the prevalence of CMOS technology and the increasing demand for millimeter-wave frequencies in integrated circuits. Recognizing the criticality of noise in these applications, our research identifies a notable research gap in the literature concerning the joint impact of white and speckle noise on PAPR OTAs. The proposed method leverages advanced circuit simulations, emphasizing the utilization of tools like Cadence Virtuoso and Keysight Advanced Design System. This approach enables a comprehensive analysis of noise sources, emphasizing the minimization of noise contributions for optimal millimeter-wave circuit performance. Initial results showcase promising advancements in noise reduction strategies, contributing to the efficacy of PAPR OTAs at high frequencies. This research not only addresses an existing gap but also provides practical insights for designers aiming to enhance the noise resilience of millimeter-wave CMOS circuits.